Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China

著者
    • Wei, Guang Hui
    • Liu, Sheng
書誌事項

Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China

Guang Hui Wei, Sheng Liu, chairs/editors ; sponsored by COEMA-China Optics and Optoelectronic manufacture's Association, CPS-Chinese Physical Society, SPIE - The International Society for Optical Engineering

(Proceedings / SPIE -- the International Society for Optical Engineering, v. 4223)

SPIE--the International Society for Optical Engineering, c2000

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注記

Includes bibliographical references and index

関連文献: 1件中  1-1を表示
  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

詳細情報
  • NII書誌ID(NCID)
    BA5305255X
  • ISBN
    • 0819438944
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Bellingham, Wash., USA
  • ページ数/冊数
    268 p.
  • 大きさ
    30 cm
  • 親書誌ID
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