Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China
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Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 4223)
SPIE--the International Society for Optical Engineering, c2000
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Includes bibliographical references and index