{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA53093819.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA53093819#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA53093819.json"},"dc:title":[{"@value":"繰り返し変形されたNi、Fe中の転位および原子空孔の陽電子消滅寿命測定法による研究"},{"@value":"クリカエシ ヘンケイサレタ Ni Feチュウノ テンイ オヨビ ゲンシ クウコウ ノ ヨウデンシ ショウメツ ジュミョウ ソクテイホウ ニ ヨル ケンキュウ","@language":"ja-hrkt"}],"dcterms:alternative":["平成10年度〜平成12年度科学研究費補助金(基盤研究(B)(2))研究成果報告書(課題番号10450235)"],"dc:creator":"研究代表者蔵元英一","dc:publisher":[{"@value":"[九州大学]"}],"dcterms:extent":"1冊","cinii:size":"30cm","dc:language":"jpneng","dc:date":"2001","cinii:ncid":"BA53093819","cinii:ownerCount":"1","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA09818635#entity","@type":"foaf:Person","foaf:name":[{"@value":"蔵元, 英一"},{"@value":"クラモト, エイイチ","@language":"ja-hrkt"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA003454","@type":"foaf:Organization","foaf:name":"九州大学 中央図書館","rdfs:seeAlso":{"@id":"https://catalog.lib.kyushu-u.ac.jp/opac_openurl/?ncid=BA53093819"}}],"prism:publicationDate":["2001.3"],"dcterms:isPartOf":[{"@id":"https://ci.nii.ac.jp/ncid/BA30193701#entity","dc:title":"科学研究費補助金(基盤研究(B)(2))研究成果報告書, 平成10年度〜平成12年度","@type":"bibo:Book"}]}]}