Fluctuations and localization in mesoscopic electron systems

Author(s)

    • Janssen Martin

Bibliographic Information

Fluctuations and localization in mesoscopic electron systems

Martin Janssen

(World Scientific lecture notes in physics, v. 64)

World Scientific, c2001

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Note

Includes bibliographical references and index

Description and Table of Contents

Description

The quantum phenomena of tunneling and interference show up not only in the microscopic world of atoms and molecules, but also in cold materials of the real world, such as metals and semiconductors. Though not fully macroscopic, such mesoscopic systems contain a huge number of particles, and the holistic nature of quantum mechanics becomes evident already in simple electronic measurements. The measured quantity fluctuates as a function of applied fields in an unpredictable, yet reproducible way. Despite this fingerprint character of fluctuations, their statistical properties are universal, i.e. they are the same for a large class of different mesoscopic systems, having only very few parameters in common. Localization of electrons is a dramatic effect of destructive interference. As a consequence a metal can become an insulator while reaching mesoscopic scales.Based on elementary quantum and statistical physics, this text introduces the theory of mesoscopic electron systems. It focuses on universal characteristics of fluctuations and on the localization mechanism. General concepts and methods are stressed, such as scaling laws for distribution functions. Tools from condensed matter theory are used flexibly. Involved technical details are skipped so as to present a broad overview of the field, including topics like quantum dots, the quantum Hall effect and a number of the most recent developments.

Table of Contents

  • Experimental facts
  • basic theoretical models and tools
  • idealized systems
  • towards realistic systems
  • the localization-delocalization transition.

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Details

  • NCID
    BA53130540
  • ISBN
    • 9810242093
  • Country Code
    si
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Singapore
  • Pages/Volumes
    xii, 205 p.
  • Size
    ill. : 22 cm
  • Parent Bibliography ID
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