Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA

Author(s)

• IEEE International Workshop on Memory Technology, Design, and Testing
• Zorian, Yervant
• Courtois, B. (Bernard)
• Wik, Thomas
• Cockburn, Bruce
• IEEE Computer Society
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Solid-State Circuits Society

Bibliographic Information

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA

editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Society

IEEE Computer Society, c2001

• : case

Other Title

PR01242

Records of the 2001 IEEE International Workshop on Memory Technology, Design and Testing

Note

"IEEE Computer Society Order Number PR01242" -- T. p. verso

Includes bibliographical references and index

Details

• NCID: BA53591736
• ISBN:
  • 0769512429
  • 0769512437
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: viii, 108 p.
• Size: 28 cm