Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA

著者

• IEEE International Workshop on Memory Technology, Design, and Testing
• Zorian, Yervant
• Courtois, B. (Bernard)
• Wik, Thomas
• Cockburn, Bruce
• IEEE Computer Society
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Solid-State Circuits Society

書誌事項

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA

editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Society

IEEE Computer Society, c2001

• : case

タイトル別名

PR01242

Records of the 2001 IEEE International Workshop on Memory Technology, Design and Testing

注記

"IEEE Computer Society Order Number PR01242" -- T. p. verso

Includes bibliographical references and index

内容説明・目次

内容説明

This volume contains the conference proceedings of the 2001 IEEE International Workshop on Memory Technology, Design and Testing.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA53591736
• ISBN:
  • 0769512429
  • 0769512437
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: viii, 108 p.
• 大きさ: 28 cm