Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA

Author(s)

• IEEE International Workshop on Memory Technology, Design, and Testing
• Zorian, Yervant
• Courtois, B. (Bernard)
• Wik, Thomas
• Cockburn, Bruce
• IEEE Computer Society
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Solid-State Circuits Society

Bibliographic Information

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA

editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Society

IEEE Computer Society, c2001

• : case

Other Title

PR01242

Records of the 2001 IEEE International Workshop on Memory Technology, Design and Testing

Note

"IEEE Computer Society Order Number PR01242" -- T. p. verso

Includes bibliographical references and index

Description and Table of Contents

Description

This volume contains the conference proceedings of the 2001 IEEE International Workshop on Memory Technology, Design and Testing.

by "Nielsen BookData"

Details

• NCID: BA53591736
• ISBN:
  • 0769512429
  • 0769512437
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: viii, 108 p.
• Size: 28 cm