2001 IEEE/SEMI Advanced Semiconductor Manufacturing Conference : "Advancing the science of semiconductor manufacturing excellence" : ASMC 2001 proceedings, 23-24 April 2001 Munich, Germany

書誌事項

2001 IEEE/SEMI Advanced Semiconductor Manufacturing Conference : "Advancing the science of semiconductor manufacturing excellence" : ASMC 2001 proceedings, 23-24 April 2001 Munich, Germany

IEEE Service Center, c2001

  • : soft

タイトル別名

01CH37160

The 12th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference : ASMC 2001 : factory dynamics, process control, advanced process technology, yield modeling and analysis, defect detection and reduction, April 23-24, International Congress Centre, Munich, Germany

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注記

Includes bibliographical references

"IEEE catalog number 01CH37160"--T.p. verso

詳細情報
  • NII書誌ID(NCID)
    BA53827366
  • ISBN
    • 0780365550
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Piscataway, NJ
  • ページ数/冊数
    vii, 244 p.
  • 大きさ
    28 cm
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