Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1998, Reno, Nevada, October 6-8, 1998

著者

• Electrical Overstress/Electrostatic Discharge Symposium
• EOS/ESD Association
• Institute of Electrical and Electronics Engineers
• IEEE Electron Devices Society

書誌事項

Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1998, Reno, Nevada, October 6-8, 1998

Sponsored by the ESD Association in cooperation with IEEE ; thechnically co-sponsored by the Electron Devices Society

ESD Association, c1998

タイトル別名

EOS/ESD Symposium proceedings : EOS-20, 98

20th Annual International EOS/ESD Symposium, 1998 proceedings / sponsored by the ESD Association in cooperation with the IEEE ; technically co-sponsored by the Electron Devices Society

98TH8347

注記

Includes bibliographies

"Ordering no. EOS-20, Approved for Public Release, Distribution Unlimited"--on T.p

"IEEE catalog no. 98TH8347"--T.p. verso

詳細情報

• NII書誌ID(NCID): BA53843067
• ISBN:
  • 1878303910
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xii, 422 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : Electronic apparatus and appliances -- Protection -- Congresses
  • LCSH : Electric discharges -- Congresses
  • LCSH : Electrostatics -- Congresses