Proceedings, Microscopy and Microanalysis 2000 : Microscopy Society of America 58th Annual Meeting : Microbeam Analysis Society 34th Annual Meeting : Microscopical Society of Canada/Societe de Microscopie du Canada 27th Annual Meeting, Philadelphia, Pennsylvania, August 13-17, 2000

著者

• Microscopy Society of America
• Annual Meeting Microscopy Society of America
• Microbeam Analysis Society
• Annual Meeting Microbeam Analysis Society
• Microscopical Society of Canada
• Microscopical Society of Canada. Annual Meeting
• Bailey, G. W.

書誌事項

Proceedings, Microscopy and Microanalysis 2000 : Microscopy Society of America 58th Annual Meeting : Microbeam Analysis Society 34th Annual Meeting : Microscopical Society of Canada/Societe de Microscopie du Canada 27th Annual Meeting, Philadelphia, Pennsylvania, August 13-17, 2000

edited by G.W. Bailey ... [et al.]

（Microscopy and Microanalysis, v. 6, suppl. 2）

Springer, 2000

タイトル別名

Proceedings, Microscopy & Microanalysis 2000, Philadelphia, Pennsylvania, August 13-17, 2000, the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, Mexican Microscopy Society, Brazillian Society for Microscopy and Microanalysis, Venezuelan Society of Electron Microscopy

詳細情報

• NII書誌ID(NCID): BA54161211
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: lxi, 1207 p.
• 大きさ: 29 cm
• 親書誌ID:
  • BA54267493