Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA

著者

• Kujawińska, Małgorzata
• Pryputniewicz, Ryszard J.
• Takeda, Mitsuo
• Society of Photo-optical Instrumentation Engineers

書誌事項

Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA

Malgorzata Kujawińska, Ryszard J. Pryputniewicz, Mitsuo Takeda chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4101）

SPIE--the International Society for Optical Engineering, c2000

注記

Includes bibliographic references and author index

詳細情報

• NII書誌ID(NCID): BA54165799
• ISBN:
  • 0819437468
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: xv, 292 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X