Proceedings, 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 24-26 October, 2001, San Francisco, California

著者

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society

書誌事項

Proceedings, 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 24-26 October, 2001, San Francisco, California

sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council

IEEE Computer Society, c2001

• : case

タイトル別名

PR01203

DFT 2001

注記

Includes bibliographical references and index

"IEEE Computer Society Press Order Number PR01203"--on T.p. verso

内容説明・目次

内容説明

This volume features the proceedings of the International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001).

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA54462160
• ISBN:
  • 0769512038
  • 0769512046
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xiii, 468 p.
• 大きさ: 23 cm