Proceedings, 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 24-26 October, 2001, San Francisco, California

Author(s)

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society

Bibliographic Information

Proceedings, 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 24-26 October, 2001, San Francisco, California

sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council

IEEE Computer Society, c2001

• : case

Other Title

PR01203

DFT 2001

Note

Includes bibliographical references and index

"IEEE Computer Society Press Order Number PR01203"--on T.p. verso

Description and Table of Contents

Description

This volume features the proceedings of the International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001).

by "Nielsen BookData"

Details

• NCID: BA54462160
• ISBN:
  • 0769512038
  • 0769512046
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xiii, 468 p.
• Size: 23 cm