Defects, recognition, imaging and physics in semiconductors, 1999 : proceedings of the eighth International Conference on Defects, Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15-18, 1999

Author(s)

• International Conference on Defects, Recognition, Imaging and Physics in Semiconductors
• 小川, 智哉 オガワ, トモヤ
• 田島, 道夫 タジマ, ミチオ

Bibliographic Information

Defects, recognition, imaging and physics in semiconductors, 1999 : proceedings of the eighth International Conference on Defects, Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15-18, 1999

edited by T. Ogawa, M. Tajima

（Journal of crystal growth, v. 210/1-3）

North-Holland : Elsevier, c2000

Note

"Special issue of Journal of crystal growth volume 210/1-3"--Back cover

Includes bibliographical references

Details

• NCID: BA54472222
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Amsterdam ; Tokyo
• Pages/Volumes: xii, 420 p.
• Size: 27 cm
• Parent Bibliography ID:
  • BA07743980