Scanning probe techniques for materials characterization at nanometer scale : proceedings of the International Symposium

Bibliographic Information

Scanning probe techniques for materials characterization at nanometer scale : proceedings of the International Symposium

editors, D.C. Hansen, H.S. Issacs, K. Sieradzki

(Proceedings / [Electrochemical Society], v. 2000-35)

Electrochemical Society, c2001

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Note

"Corrosion, Electrodeposition and Physical Electrochemistry Divisions"--on T.p

Includes bibliographical references and indexes

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  • Proceedings

    [Electrochemical Society]

    Electrochemical Society

Details

  • NCID
    BA54496592
  • ISBN
    • 1566773024
  • LCCN
    01086650
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Pennington, N.J.
  • Pages/Volumes
    viii, 212 p.
  • Size
    24 cm
  • Parent Bibliography ID
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