Scattering and surface roughness III : 1-2 August 2000, San Diego, USA

Author(s)

• Gu, Zu-Han
• Maradudin, A. A.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Scattering and surface roughness III : 1-2 August 2000, San Diego, USA

Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4100）

SPIE, c2000

Note

Includes bibliographical references and index

Details

• NCID: BA54588318
• ISBN:
  • 081943745X
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: vii, 222 p.
• Size: 28 cm
• Classification:
  • LCC : TA418.7
  • DC21 : 620/.44
• Subject Headings:
  • LCSH : Surface roughness -- Measurement Congresses
  • LCSH : Light -- Scattering Congresses
  • LCSH : Electromagnetic waves -- Scattering Congresses
• Parent Bibliography ID:
  • BA0022700X