Scattering and surface roughness III : 1-2 August 2000, San Diego, USA

著者

• Gu, Zu-Han
• Maradudin, A. A.
• Society of Photo-optical Instrumentation Engineers

書誌事項

Scattering and surface roughness III : 1-2 August 2000, San Diego, USA

Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4100）

SPIE, c2000

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA54588318
• ISBN:
  • 081943745X
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: vii, 222 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA418.7
  • DC21 : 620/.44
• 件名:
  • LCSH : Surface roughness -- Measurement Congresses
  • LCSH : Light -- Scattering Congresses
  • LCSH : Electromagnetic waves -- Scattering Congresses
• 親書誌ID:
  • BA0022700X