International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA

Author(s)

• International Test Conference
• IEEE Computer Society. Test Technology Technical Council
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA

sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section

International Test Conference, c2001

Other Title

01CH37260

Note

Description from cover

"IEEE Catalog Number 01CH37260"--p. ii

Includes bibliographical references and index

Details

• NCID: BA54697324
• ISBN:
  • 0780371690
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington, D.C.
• Pages/Volumes: xiv, 1201 p.
• Size: 29 cm
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses