Targets and backgrounds VI : characterization, visualization, and the detection process : 24-26 April 2000, Orlando, USA
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Targets and backgrounds VI : characterization, visualization, and the detection process : 24-26 April 2000, Orlando, USA
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 4029)
SPIE, c2000
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Includes bibliographical references and index