Dislocations and deformation mechanisms in thin films and small structures : symposium held April 17-19, 2001, San Francisco, California, U.S.A.

著者

    • Kraft, Oliver

書誌事項

Dislocations and deformation mechanisms in thin films and small structures : symposium held April 17-19, 2001, San Francisco, California, U.S.A.

editors, Oliver Kraft ... [et al.]

(Materials Research Society symposium proceedings, v. 673)

Materials Research Society, c2001

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注記

Includes bibliographical references and indexes

内容説明・目次

内容説明

The mechanical properties of small volumes of materials such as thin films and patterned structures can be very different from the mechanical properties of those same materials in bulk. Many explanations of the mechanical behaviors of such small volumes have depended on simplified models of dislocation behavior. However, recent developments in dislocation modeling have made it possible to understand dislocation behavior in much more detail than before. A wide range of topics is presented in these proceedings, including mechanisms of plastic deformation in heteroepitaxial, multilayered and polycrystalline thin films, as well as three-dimensional mesostructures such as epitaxial islands, semiconducting devices and microcrystallites. Experimental, theoretical and numerical simulations are addressed. Topics include: dislocation and deformation mechanisms in thin metal films and multilayers; discrete dislocations - observations and simulations; dislocations and deformation mechanisms in thin films and small structures; dislocations in small structures; dislocations and deformation in epitaxial layers; dislocation fundamentals -observations, calculations and simulations.

目次

  • Part I. Dislocation and Deformation Mechanisms in Thin Metal Films and Multilayers I
  • Part II. Discrete Dislocations: Observations and Simulations
  • Part III. Dislocations and Deformation Mechanisms in Thin Films and Small Structures
  • Part IV. Dislocations in Small Structures
  • Part V. Dislocations and Deformation in Epitaxial Layers
  • Part VI. Dislocation Fundamentals: Observations, Calculations and Simulations
  • Part VII. Dislocations and Deformation Mechanisms in Thin Metal Films and Multilayers II
  • Author index
  • Subject index.

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詳細情報

  • NII書誌ID(NCID)
    BA55091268
  • ISBN
    • 1558996095
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Warrendale, PA
  • ページ数/冊数
    1 v.
  • 大きさ
    24 cm
  • 親書誌ID
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