Methods of measurement for semiconductor materials, process control, and devices: quarterly report, January 1 to March 31, 1969

著者

• Bullis, M. Murray

書誌事項

Methods of measurement for semiconductor materials, process control, and devices: quarterly report, January 1 to March 31, 1969

edited by M. Murray Bullis

（NBS technical note, 488）

U.S. Dept. of Commerce, National Bureau of Standards , For sale by the Superintendent of Documents, U.S. Govt. Print. Off., 1969

• NII書誌ID(NCID): BA56325863
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Washington],Washington
• ページ数/冊数: iv, 41 p.
• 大きさ: 26 cm
• 親書誌ID:
  • BA12630826