Electron microscopy and analysis 2001 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Dundee, 5-7 September 2001
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書誌事項
Electron microscopy and analysis 2001 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Dundee, 5-7 September 2001
（Institute of Physics conference series, no. 168）
Institute of Physics Pub., c2001
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注記
Includes index
内容説明・目次
内容説明
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.
目次
Preface
Plenary Lectures
HREM and Electron Crystallography
Advanced SEM and Surface Science
New Instrumentation, Imaging, and Analysis
Ferrous Metals and Intermetallics
Advanced Microanalysis and Elemental Imaging
Carbons, Ceramics, and Composites
Microscopy of Interfaces and Surfaces
Catalysts, Sensors, and Environmental Materials
Semiconductors, Superconductors, and Magnetic Materials
Scanning Probe Microscopy
Author Index
Subject Index
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