Annual Reliability and Maintainability Symposium : 2002 proceedings : Seattle, Washington USA, 2002 January 28-31

Author(s)

• Reliability and Maintainability Symposium

Bibliographic Information

Annual Reliability and Maintainability Symposium : 2002 proceedings : Seattle, Washington USA, 2002 January 28-31

Institute of Electrical and Electronics Engineers, c2002

• : soft.
• : CD-ROM

Other Title

02CH37318

Note

Includes bibliographical references and index

"IEEE catalog number: 02CH37318" -- T. p. verso

"The International Symposium on Product Quality & Integrity"

Details

• NCID: BA5654853X
• ISBN:
  • 0780373480
  • 0780373499
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, NJ
• Pages/Volumes: xxiv, 662 p.
• Size: 28 cm
• Classification:
  • NDC8 : 509.8