System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday

著者

• Barlow, Richard E.
• Hayakawa, Yu
• Irony, Telba
• Xie, Min

書誌事項

System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday

editors Yu Hayakawa, Telbe, Irony, Min Xie

（Series on quality, reliability, and engineering statistics, v. 5）

World Scientific, c2001

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA5655566X
• ISBN:
  • 9810248652
• 出版国コード: si
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Singapore ; River Edge, NJ
• ページ数/冊数: xxvii, 409 p.
• 大きさ: 23 cm
• 親書誌ID:
  • BA37266563