Si front-end processing -- physics and technology of dopant-defect interactions III : symposium held April 17-19, 2001, San Francisco, California, U.S.A.

Author(s)

    • Jones, Erin C.
    • Jones, Kevin S.
    • Giles, Martin D.
    • Stolk, Peter
    • Matsuo, Jiro

Bibliographic Information

Si front-end processing -- physics and technology of dopant-defect interactions III : symposium held April 17-19, 2001, San Francisco, California, U.S.A.

editors, Erin C. Jones ... [et al.]

(Materials Research Society symposium proceedings, v. 669)

Materials Research Society, c2001

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Note

Includes bibliographical references and indexes

Related Books: 1-1 of 1

Details

  • NCID
    BA56818510
  • ISBN
    • 1558996052
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Warrendale, PA
  • Pages/Volumes
    1 v.
  • Size
    24 cm
  • Parent Bibliography ID
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