Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability

Author(s)

    • Dumin, D. J.

Bibliographic Information

Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability

editor, D. J. Dumin

（Selected topics in electronics and systems, v. 23）

World Scientific, c2002

Available at  / 3 libraries

Search this Book/Journal

Related Books： 1-1 of 1

Details

  • NCID
    BA56959953
  • ISBN
    • 9810248423
  • Country Code
    si
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Singapore ; New Jersey ; London ; Hong Kong
  • Pages/Volumes
    ix, 270 p.
  • Size
    26 cm
  • Parent Bibliography ID
Page Top