2002 IEEE International Reliability Physics Symposium proceedings : 40th annual, Dallas, Texas, April 7-11, 2002
著者
書誌事項
2002 IEEE International Reliability Physics Symposium proceedings : 40th annual, Dallas, Texas, April 7-11, 2002
Institute of Electrical and Electronics Engineers, c2002
- : soft.
- タイトル別名
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02CH37320
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注記
Includes bibliographical references
"IEEE Catalog No. 02CH37320" -- T. p.
内容説明・目次
内容説明
This CD-ROM originates from the 2002 IEEE International Reliability Physics Symposium, and is concerned with electron devices. Its contents include: non volatile memory; dielectrics; hot carriers; assembly/packaging; device dielectrics; interconnects; product reliability; and device and process.
目次
- Non Volatile Memory
- Dielectrics
- Hot Carriers
- Assembly/Packaging
- Device Dielectrics
- Device & Process
- Interconnects
- Non Volatile Memory
- Product Reliability
- Compound Semiconductor Failure Analysis
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