2002 IEEE International Reliability Physics Symposium proceedings : 40th annual, Dallas, Texas, April 7-11, 2002

著者

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

2002 IEEE International Reliability Physics Symposium proceedings : 40th annual, Dallas, Texas, April 7-11, 2002

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2002

• : soft.

タイトル別名

02CH37320

注記

Includes bibliographical references

"IEEE Catalog No. 02CH37320" -- T. p.

詳細情報

• NII書誌ID(NCID): BA56996472
• ISBN:
  • 0780373529
• LCCN: 82640313
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N.J.
• ページ数/冊数: viii, 476 p.
• 大きさ: 28 cm