書誌事項

Handbook of X-ray spectrometry

edited by René E. van Grieken, Andrzej A. Markowicz

(Practical spectroscopy, v. 29)

Marcel Dekker, c2002

2nd ed., Revised and expanded

この図書・雑誌をさがす
注記

Includes bibliographical references and index

内容説明・目次

内容説明

"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."

目次

  • X-ray physics
  • wavelength-dispersive X-ray fluorescence
  • energy-dispersive x-ray flourescences
  • data analysis
  • quantification in XRF analysis of infinitely thick samples
  • quantification in XRF analysis of intermediate-thickness samples
  • radioisotope X-ray analysis
  • synchrotron radiation X-ray emission
  • total-reflection XRF
  • polarized beam XRF
  • capillary beam XRF or X-ray micro-flourescence
  • particle-induced X-ray emission
  • electron-induced X-ray emission
  • sample preparation for XRF.

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詳細情報
  • NII書誌ID(NCID)
    BA57743177
  • ISBN
    • 0824706005
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    New York ; Basel
  • ページ数/冊数
    xvi, 983 p.
  • 大きさ
    26 cm
  • 分類
  • 件名
  • 親書誌ID
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