Handbook of X-ray spectrometry
著者
書誌事項
Handbook of X-ray spectrometry
（Practical spectroscopy, v. 29）
Marcel Dekker, c2002
2nd ed., Revised and expanded
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
目次
- X-ray physics
- wavelength-dispersive X-ray fluorescence
- energy-dispersive x-ray flourescences
- data analysis
- quantification in XRF analysis of infinitely thick samples
- quantification in XRF analysis of intermediate-thickness samples
- radioisotope X-ray analysis
- synchrotron radiation X-ray emission
- total-reflection XRF
- polarized beam XRF
- capillary beam XRF or X-ray micro-flourescence
- particle-induced X-ray emission
- electron-induced X-ray emission
- sample preparation for XRF.
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