Fundamental gas-phase and surface chemistry of vapor-phase deposition II and process control, diagnostics, and modeling in semiconductor manufacturing IV : proceedings of the international symposium

Bibliographic Information

Fundamental gas-phase and surface chemistry of vapor-phase deposition II and process control, diagnostics, and modeling in semiconductor manufacturing IV : proceedings of the international symposium

editors, M.T. Swihart, M.D. Allendorf, M. Meyyappan

(Proceedings / [Electrochemical Society], v. 2001-13)

Electrochemical Society, c2001

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Includes bibliographical references and indexes

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  • Proceedings

    [Electrochemical Society]

    Electrochemical Society

Details

  • NCID
    BA59006533
  • ISBN
    • 1566773199
  • LCCN
    2001092515
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Pennington, N.J.
  • Pages/Volumes
    ix, 508 p.
  • Size
    24 cm
  • Parent Bibliography ID
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