Proceedings of 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001) : 2001 Asian Conference on Electrical Insulation Diagnosis (ACEID 2001) : 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in Systems , November 19-22, 2001, Hoel Sungarden Himeji, Himeji, Japan

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書誌事項

Proceedings of 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001) : 2001 Asian Conference on Electrical Insulation Diagnosis (ACEID 2001) : 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in Systems , November 19-22, 2001, Hoel Sungarden Himeji, Himeji, Japan

sponsored by IEEJ Technical Committee on Dielectrics and Electrical Insulation, IEEE Dielectrics and Electrical Insulation Society ; in cooperation with Korean Institute of Electrical and Electronic Material Engineers ... [et al.]

Institute of Electrical Engineers of Japan, c2001

  • softbound

タイトル別名

ISEIM 2001

ACEID 2001

98TH8286

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注記

Includes bibliographical references and author index

"IEEE catalog number 01TH8544"

内容説明・目次

内容説明

This volume originates from the 2001 International Symposium on Electrical Insulating Materials and covers topics including: electrical conduction and breakdown in dielectrics; insulation design and reliability; and dielectric materials for electronics.

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