Proceedings of the 2001, 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2001

著者

• International Symposium on the Physical & Failure Analysis of Integrated Circuits
• Tan, Wilson
• IEEE Singapore Section. Reliability/CPMT/EDA Chapter
• IEEE Electron Devices Society
• National University of Singapore. Centre for IC Failure Analysis and Reliability
• Institute of Microelectronics

書誌事項

Proceedings of the 2001, 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2001

edited by Wilson Tan ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, Singapore

Institute of Electrical and Electronics Engineers, c2001

タイトル別名

8th International Symposium on th Physical & Failure Analysis of Integrated Circuits 2001

IPFA 2001

注記

"IEEE catalog number 01TH8548"--T.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA59009735
• ISBN:
  • 0780366751
• LCCN: 00110824
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: 262 p.
• 大きさ: 30 cm