Proceedings of the 2001, 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2001

著者

• International Symposium on the Physical & Failure Analysis of Integrated Circuits
• Tan, Wilson
• IEEE Singapore Section. Reliability/CPMT/EDA Chapter
• IEEE Electron Devices Society
• National University of Singapore. Centre for IC Failure Analysis and Reliability
• Institute of Microelectronics

書誌事項

Proceedings of the 2001, 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2001

edited by Wilson Tan ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, Singapore

Institute of Electrical and Electronics Engineers, c2001

タイトル別名

8th International Symposium on th Physical & Failure Analysis of Integrated Circuits 2001

IPFA 2001

注記

"IEEE catalog number 01TH8548"--T.p. verso

Includes bibliographical references and index

内容説明・目次

内容説明

This volume contains the conference proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA59009735
• ISBN:
  • 0780366751
• LCCN: 00110824
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: 262 p.
• 大きさ: 30 cm