Proceedings, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2002, 6-8 November 2002, Vancouver, BC, Canada

Author(s)

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society

Bibliographic Information

Proceedings, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2002, 6-8 November 2002, Vancouver, BC, Canada

[sponsored by the IEEE Computer Society Test Technology Technical Council, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing]

IEEE Computer Society, c2002

Note

Includes bibliographical references and index

"IEEE Computer Society Press Order Number PR01831"--on T.p. verso

Details

• NCID: BA59271975
• ISBN:
  • 0769518311
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xiii, 441 p.
• Size: 23 cm