Proceedings, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2002, 6-8 November 2002, Vancouver, BC, Canada

著者

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society

書誌事項

Proceedings, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2002, 6-8 November 2002, Vancouver, BC, Canada

[sponsored by the IEEE Computer Society Test Technology Technical Council, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing]

IEEE Computer Society, c2002

注記

Includes bibliographical references and index

"IEEE Computer Society Press Order Number PR01831"--on T.p. verso

詳細情報

• NII書誌ID(NCID): BA59271975
• ISBN:
  • 0769518311
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xiii, 441 p.
• 大きさ: 23 cm