2002 IEEE AUTOTESTCON proceedings, Systems Readiness Technology Conference : the new millennium challenge-transforming test

Author(s)

• Autotestcon
• IEEE Aerospace and Electronic Systems Society
• IEEE Instrumentation and Measurement Society
• IEEE Huntsville Section

Bibliographic Information

2002 IEEE AUTOTESTCON proceedings, Systems Readiness Technology Conference : the new millennium challenge-transforming test

sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Huntsville Section

IEEE Service Center, c2002

Other Title

Systems Readiness Technology Conference proceedings, AUTOTESTCON 2002, Huntsville Alabama

AUTOTESTCON 2002

Note

"IEEE catalog no. 02CH37350"

Details

• NCID: BA5930648X
• ISBN:
  • 078037441X
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, NJ
• Pages/Volumes: xxxi, 919 p.
• Size: 28 cm