International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA

著者

• International Test Conference
• IEEE Computer Society. Test Technology Technical Council
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA

sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section

International Test Conference, c2002

注記

Title from cover

"IEEE Catalog Number 02CH37382"--P. ii

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA59306515
• ISBN:
  • 0780375424
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington, D.C.
• ページ数/冊数: xvi, 1250 p.
• 大きさ: 29 cm
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses