Charged particle detection, diagnostics, and imaging : 30 July - 2 August 2001 San Diego, USA

著者

• Delage, Olivier
• Munro, Eric
• Rouse, John A.

書誌事項

Charged particle detection, diagnostics, and imaging : 30 July - 2 August 2001 San Diego, USA

Olivier Delage, Eric Munro, John A. Rouse chairs/editors ; Sponsored and published by SPIE-The International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4510）

SPIE, c2001

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA59875248
• ISBN:
  • 0819442240
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: ix, 236 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X