Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California

著者

• Fallahi, Mahmoud
• Linden, Kurt J.
• Wang, S. C. (Shing Chung)

書誌事項

Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California

Mahmoud Fallahi, Kurt J. Linden, S.C. Wang

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3626）

SPIE, c1999

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA60548136
• ISBN:
  • 081943096X
• LCCN: 00500663
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: viii, 262 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA1700
  • DC21 : 621.36/6
• 件名:
  • LCSH : Semiconductor lasers Congresses
• 親書誌ID:
  • BA0022700X