Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California

著者

    • Tobin, Kenneth W.
    • Chang, Ning-San
    • IS & T--the Society for Imaging Science and Technology
    • Society of Photo-optical Instrumentation Engineers

書誌事項

Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California

Kenneth W. Tobin, Ning S. Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3652）

SPIE, c1999

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注記

Includes bibliographical references and index

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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