Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts

Author(s)

• Miller, John W. V.
• Solomon, Susan Snell
• Batchelor, Bruce G.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts

John W.V. Miller, Susan Snell Solomon, Bruce G. Batchelor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3836）

SPIE, c1999

Note

Includes bibliographic references and author index

Details

• NCID: BA60628097
• ISBN:
  • 0819434299
• LCCN: 00266009
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: vii, 252 p.
• Size: 28 cm
• Classification:
  • LCC : TA1634
  • DC21 : 670.42/5
• Subject Headings:
  • LCSH : Computer vision Congresses
  • LCSH : Engineering inspection -- Automation Congresses
  • LCSH : Optical measurements Congresses
  • LCSH : Computer vision -- Industrial applications Congresses
• Parent Bibliography ID:
  • BA0022700X