Pattern recognition, chemometrics, and imaging for optical environmental monitoring : 20-21 September 1999, Boston, Massahcusetts

著者
    • Siddiqu, Khalid J.
    • Eastwood, Delyle
書誌事項

Pattern recognition, chemometrics, and imaging for optical environmental monitoring : 20-21 September 1999, Boston, Massahcusetts

Khalid J. Siddiqui, Delyle Eastwood, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering

(Proceedings / SPIE -- the International Society for Optical Engineering, v. 3854)

SPIE, c1999

この図書・雑誌をさがす
注記

Includes bibliographical references and indexes

内容説明・目次

内容説明

This work presents a selection of papers dealing with various aspects of pattern recognition, chemometrics and imaging for optical environment monitoring.

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

詳細情報
  • NII書誌ID(NCID)
    BA6063395X
  • ISBN
    • 0819434477
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Bellingham, Wash.
  • ページ数/冊数
    viii, 142 p.
  • 大きさ
    28 cm
  • 親書誌ID
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