Proceedings, Microscopy and Microanalysis 2002 : Microscopy Society of America 60th Annual Meeting : Microbeam Analysis Society 36th Annual Meeting : Microscopy Society of Canada Société de Microscopie du Canada 29th Annual Meeting : International Metallographic Society 35th Annual Meeting, Québec City, Québec, Canada, August 5-8, 2002

著者

• Microscopy Society of America
• Annual Meeting Microscopy Society of America
• Microbeam Analysis Society
• Annual Meeting Microbeam Analysis Society
• Microscopy Society of Canada
• Annual Meeting. Microscopy Society of Canada
• International Metallographic Society
• Annual Meeting. International Metallographic Society
• Voelkl, Edgar

書誌事項

Proceedings, Microscopy and Microanalysis 2002 : Microscopy Society of America 60th Annual Meeting : Microbeam Analysis Society 36th Annual Meeting : Microscopy Society of Canada = Société de Microscopie du Canada 29th Annual Meeting : International Metallographic Society 35th Annual Meeting, Québec City, Québec, Canada, August 5-8, 2002

edited by E. Voelkl ... [et al.]

（Microscopy and Microanalysis, v. 8, suppl. 2）

Microscopy Society of America, 2002

注記

Includes 1 CD-ROM

詳細情報

• NII書誌ID(NCID): BA60665355
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York, N. Y.
• ページ数/冊数: lxiii, 480 p.
• 大きさ: 29 cm
• 付属資料: CD-ROM
• 親書誌ID:
  • BA54267493