Scanning and force microscopies for biomedical applications : 23-24 January 2000, San Jose, California

著者

• Tamiya, Eiichi
• Nie, Shuming
• Yeung, Edward S.
• Society of Photo-optical Instrumentation Engineers
• International Biomedical Optics Society

書誌事項

Scanning and force microscopies for biomedical applications : 23-24 January 2000, San Jose, California

Shuming Nie, Eiichi Tamiya, Edward S. Yeung, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, IBOS--International Biomedical Optics Society

（Progress in biomedical optics and imaging, vol. 1, no. 16）（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3922）

SPIE, c2000

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA60673091
• ISBN:
  • 0819435384
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: ix, 246 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA51116822
  • BA0022700X