Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California

Author(s)

• Burnham, Geoffrey T.
• He, Xiaoguang
• Linden, Kurt J.
• Wang, S. C.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California

Geoffrey T. Burnham...[et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3945）

SPIE, c2000

Note

Includes bibliographical references and index

Details

• NCID: BA60692449
• ISBN:
  • 0819435627
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: viii, 320 p.
• Size: 28 cm
• Parent Bibliography ID:
  • BA0022700X