Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California

著者

• Burnham, Geoffrey T.
• He, Xiaoguang
• Linden, Kurt J.
• Wang, S. C.
• Society of Photo-optical Instrumentation Engineers

書誌事項

Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California

Geoffrey T. Burnham...[et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3945）

SPIE, c2000

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA60692449
• ISBN:
  • 0819435627
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: viii, 320 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X