Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

著者

    • Tobin, Kenneth W.
    • IS & T--the Society for Imaging Science and Technology
    • Society of Photo-optical Instrumentation Engineers

書誌事項

Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3966）

SPIE, c2000

大学図書館所蔵 件 / 全2件

この図書・雑誌をさがす

注記

Includes bibliographical references and index

関連文献： 1件中  1-1を表示

  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

詳細情報

ページトップへ