Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

著者

• Tobin, Kenneth W.
• IS & T--the Society for Imaging Science and Technology
• Society of Photo-optical Instrumentation Engineers

書誌事項

Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3966）

SPIE, c2000

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA60700263
• ISBN:
  • 0819435848
• LCCN: 2001267693
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: ix, 396 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TS156.2.
  • DC21 : 670.42/5
• 件名:
  • LCSH : Engineering inspection -- Automation -- Congresses
  • LCSH : Computer vision -- Industrial applications -- Congresses
  • LCSH : Quality control -- Optical methods -- Automation -- Congresses
  • LCSH : Mensuration -- Congresses
• 親書誌ID:
  • BA0022700X