Critical technologies for the future of computing : 31 July-4 August 2000, San Diego, USA

著者

• Bains, Sunny
• Irakliotis, Leo J.
• Society of Photo-optical Instrumentation Engineers

書誌事項

Critical technologies for the future of computing : 31 July-4 August 2000, San Diego, USA

Sunny Bains, Leo J. Irakliotis, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4109）

SPIE, c2000

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA60715158
• ISBN:
  • 0819437549
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: vii, 332 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X