Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA

著者

• Harding, Kevin G.
• Miller, John W. V.
• Batchelor, Bruce G.
• Society of Photo-optical Instrumentation Engineers

書誌事項

Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA

Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4189）

SPIE, c2001

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA60719308
• ISBN:
  • 0819438545
• LCCN: 2001270560
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: vii, 296 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA1634
• 件名:
  • LCSH : Computer vision -- Congresses
  • LCSH : Computer vision -- Industrial applications -- Congresses
  • LCSH : Three-dimensional display systems -- Congresses
  • LCSH : Quality control -- Optical methods -- Congresses
  • LCSH : Metrology -- Congresses
• 親書誌ID:
  • BA0022700X