Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA

Author(s)

• Harding, Kevin G.
• Miller, John W. V.
• Batchelor, Bruce G.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA

Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4189）

SPIE, c2001

Note

Includes bibliographical references and index

Details

• NCID: BA60719308
• ISBN:
  • 0819438545
• LCCN: 2001270560
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: vii, 296 p.
• Size: 28 cm
• Classification:
  • LCC : TA1634
• Subject Headings:
  • LCSH : Computer vision -- Congresses
  • LCSH : Computer vision -- Industrial applications -- Congresses
  • LCSH : Three-dimensional display systems -- Congresses
  • LCSH : Quality control -- Optical methods -- Congresses
  • LCSH : Metrology -- Congresses
• Parent Bibliography ID:
  • BA0022700X