Proceedings : the seventh IEEE European Test Workshop : ETW '02 : 26-29 May 2002, Corfu, Greece

著者

• IEEE European Test Workshop
• IEEE Computer Society Test Technology Counsil
• University of Piraeus
• University of Athens
• Ericsson, Applied Technologies

書誌事項

Proceedings : the seventh IEEE European Test Workshop : ETW '02 : 26-29 May 2002, Corfu, Greece

sponsored by IEEE Computer Society Test Technology Counsil (TTTC), organized by University of Piraeus, University of Athens ; supported by Ericsson, Applied Technologies ... [et al.]

IEEE Computer Society, c2002

タイトル別名

ETW '02 : 7th IEEE European Test Workshop, Corfu, Greece : proceedings : May 26-29, 2002

注記

Includes bibliographic references and index

"IEEE Computer Society Order Number PR01715"--T.p. verso

内容説明・目次

内容説明

Seventeen contributions to the May 2002 conference (devoted to issues of electronic-based circuit and system testing) are presented here. Topics include silicon technology advances and implications on test, a test time reduction algorithm for test architecture design for core-based systems, modeling

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA60789992
• ISBN:
  • 0769517153
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xiii, 130 p.
• 大きさ: 28 cm