Nanostructured interfaces : symposium held April 2-4, 2002, San Francisco, California, U.S.A.

著者

    • Plitzko, Juergen M.

書誌事項

Nanostructured interfaces : symposium held April 2-4, 2002, San Francisco, California, U.S.A.

editors, Juergen M. Plitzko ... [et al.]

(Materials Research Society symposium proceedings, v. 727)

Materials Research Society, c2002

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注記

Includes bibliographical references and indexes

内容説明・目次

内容説明

More than half the volume of nanostructured materials consists of interfaces, and these determine the materials' properties. Even though the processing of nanostructured materials has advanced enormously, the basic nature of interfaces and their influence to properties remains elusive. For example, the adhesion and passivation of nanoassemblies, which are crucial for applications, are currently not well understood. This book, first published in 2002, focuses on the basic science of interfaces in nanostructured materials, emphasizing characterization at the atomic level. Experimental investigations, utilizing transmission electron microscopy (TEM) and analytical electron microscopy (AEM), such as energy filtered TEM (EFTEM) and electron energy loss spectroscopy (EELS), are featured. Advanced theoretical studies on various nanostructured materials are also addressed. Topics include: characterization of nanostructured interfaces; nanostructured interfaces in catalysts and sensors; catalysts and sensors; structural materials; magnetic materials; nanostructured interfaces in structural and magnetic materials and in oxides and electro-optical materials; electro-optical materials; electronic materials; and nanostructured interfaces in electronic materials.

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詳細情報

  • NII書誌ID(NCID)
    BA60850652
  • ISBN
    • 155899663X
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Warrendale, PA
  • ページ数/冊数
    ix, 186 p.
  • 大きさ
    24 cm
  • 親書誌ID
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